APA (7th ed.) Citation

SpringerLink (Online service), Sadewasser, S., & Glatzel, T. (2018). Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (1st ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-75687-5

Chicago Style (17th ed.) Citation

SpringerLink (Online service), Sascha Sadewasser, and Thilo Glatzel. Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization. 1st ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-75687-5.

MLA (8th ed.) Citation

SpringerLink (Online service), et al. Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization. 1st ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-75687-5.