Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Sadewasser, Sascha (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Glatzel, Thilo (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: Springer Series in Surface Sciences, 65
• Θέματα: Spectroscopy.; Microscopy.; Materials-Surfaces.; Thin films.; Nanotechnology.; Materials science.; Physical measurements.; Measurement .; Spectroscopy and Microscopy.; Surfaces and Interfaces, Thin Films.; Nanotechnology and Microengineering.; Characterization and Evaluation of Materials.; Measurement Science and Instrumentation.

This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular...