Multi-run Memory Tests for Pattern Sensitive Faults

• Main Author: Mrozek, Ireneusz (Author, http://id.loc.gov/vocabulary/relators/aut)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Edition: 1st ed. 2019.
• Subjects: Electronic circuits.; Microprocessors.; Electronics.; Microelectronics.; Circuits and Systems.; Processor Architectures.; Electronics and Microelectronics, Instrumentation.

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing...