Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces /

• Κύριος συγγραφέας: Kaupp, Gerd (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
• Θέματα: Engineering.; Science.; Physical chemistry.; Optics.; Optoelectronics.; Plasmons (Physics).; Nanotechnology.; Nanotechnology and Microengineering.; Science, general.; Physical Chemistry.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Engineering, general.

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a l...

Πίνακας περιεχομένων:

• Atomic Force Microscopy
• Scanning Near-Field Optical Microscopy
• Nanoindentation
• Nanoscratching.