Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching Application to Rough and Natural Surfaces /

• Main Author: Kaupp, Gerd (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
• Subjects: Engineering.; Science.; Physical chemistry.; Optics.; Optoelectronics.; Plasmons (Physics).; Nanotechnology.; Nanotechnology and Microengineering.; Science, general.; Physical Chemistry.; Optics, Optoelectronics, Plasmonics and Optical Devices.; Engineering, general.

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a l...