Nanoscale Spectroscopy and Its Applications to Semiconductor Research

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Watanabe, Y. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Heun, S. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Salviati, G. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Yamamoto, N. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2002.
• Έκδοση: 1st ed. 2002.
• Σειρά: Lecture Notes in Physics, 588
• Θέματα: Nanotechnology.; Optical materials.; Electronic materials.; Solid state physics.; Spectroscopy.; Microscopy.; Physical measurements.; Measurement .; Optical and Electronic Materials.; Solid State Physics.; Spectroscopy and Microscopy.; Measurement Science and Instrumentation.

Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- trosc...