Nanoscale Spectroscopy and Its Applications to Semiconductor Research

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Watanabe, Y. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Heun, S. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Salviati, G. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Yamamoto, N. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2002.
• Έκδοση: 1st ed. 2002.
• Σειρά: Lecture Notes in Physics, 588
• Θέματα: Nanotechnology.; Optical materials.; Electronic materials.; Solid state physics.; Spectroscopy.; Microscopy.; Physical measurements.; Measurement .; Optical and Electronic Materials.; Solid State Physics.; Spectroscopy and Microscopy.; Measurement Science and Instrumentation.

Fabrication technologies for nanostructured devices have be- en developed recently, and the electrical and optical pro- perties of such nanostructures are a subject of advanced re- search. This book describes the different approaches to spectroscopic microscopy, i.e., electron beam probe spec- trosc...

Πίνακας περιεχομένων:

• Spectro-microscopy by TEM-SEM
• Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Electron Microscopy
• Development of Cathodoluminescence (CL) for Semiconductor Research, Part I: TEM-CL Study of Microstructures and Defects in Semiconductor Epilayers
• Development of CL for Semiconductor Research, Part II: Cathodoluminescence Study of Semiconductor Nanoparticles and Nanostructures Using Low-Electron-Beam Energies
• Development of CL for Semiconductor Research, Part III: Study of Degradation Mechanisms in Compound Semiconductor-Based Devices by SEM-CL
• Microcharacterization of Conformal GaAs on Si Layers by Spatially Resolved Optical Techniques
• Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction
• Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics
• Long-Term Oxidation Behaviour of Lead Sulfide Surfaces
• Cross-Sectional Photoemission Spectromicroscopy of Semiconductor Heterostructures
• Surface Imaging Using Electrons Excited by Metastable-Atom Impacts
• Application of Photoemission Electron Microscopy to Magnetic Domain Imaging
• Photoelectron Spectroscopy with a Photoemission Electron Microscope
• X-ray Photoemission and Low-Energy Electron Microscope
• Application of Imaging-Type Photoelectron Spectromicroscopy to Solid-State Physics
• Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures
• Novel Tuning Fork Sensor for Low-Temperature Near-Field Spectroscopy
• Manipulating, Reacting, and Constructing Single Molecules with a Scanning Tunneling Microscope Tip
• Electron-Beam-Induced Decomposition of SiO2 Overlay on Si in STM Nanolithography
• Direct Imaging of InGaAs Quantum Dot States by Scanning Tunneling Spectroscopy
• Growth and Characterization of Ge Nanostructures on Si(111)
• Imaging of Zero-Dimensional States in Semiconductor Nanostructures Using Scanning Tunneling Microscopy
• Electronic-Excitation-Induced Enhancement in Metallicity on HOPG and Si Surfaces: In Situ STM/STS Studies
• Electronic Properties of Polycrystalline and Amorphous WO3 Investigated with Scanning Tunnelling Spectroscopy
• Probing of Electronic Transitions with Atomic-Scale Spatial Resolution in Semiconductor Quantum Well Structures
• Scanning Tunneling Microscope-Induced Light Emission from Nanoscale Structures.