Anomalous X-Ray Scattering for Materials Characterization Atomic-Scale Structure Determination /

• Κύριος συγγραφέας: Waseda, Yoshio (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2002.
• Έκδοση: 1st ed. 2002.
• Σειρά: Springer Tracts in Modern Physics, 179
• Θέματα: Materials-Surfaces.; Thin films.; Materials science.; Surfaces and Interfaces, Thin Films.; Characterization and Evaluation of Materials.

The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersio...