Waseda, Y., & Waseda, Y. (2002). Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (1st ed. 2002.). Springer Berlin Heidelberg : Imprint: Springer. https://doi.org/10.1007/3-540-46008-X
Παραπομπή σε μορφή Chicago (17η εκδ.)Waseda, Yoshio, και Yoshio Waseda. Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination. 1st ed. 2002. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2002. https://doi.org/10.1007/3-540-46008-X.
Παραπομπή σε μορφή MLA (8th εκδ.)Waseda, Yoshio, και Yoshio Waseda. Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination. 1st ed. 2002. Springer Berlin Heidelberg : Imprint: Springer, 2002. https://doi.org/10.1007/3-540-46008-X.
