APA (7th ed.) Citation

Waseda, Y., & Waseda, Y. (2002). Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination (1st ed. 2002.). Springer Berlin Heidelberg : Imprint: Springer. https://doi.org/10.1007/3-540-46008-X

Chicago Style (17th ed.) Citation

Waseda, Yoshio, and Yoshio Waseda. Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination. 1st ed. 2002. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2002. https://doi.org/10.1007/3-540-46008-X.

MLA (8th ed.) Citation

Waseda, Yoshio, and Yoshio Waseda. Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination. 1st ed. 2002. Springer Berlin Heidelberg : Imprint: Springer, 2002. https://doi.org/10.1007/3-540-46008-X.