X-Ray Scattering from Soft-Matter Thin Films Materials Science and Basic Research /

• Main Author: Tolan, Metin (Author, http://id.loc.gov/vocabulary/relators/aut)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 1999.
• Edition: 1st ed. 1999.
• Series: Springer Tracts in Modern Physics, 148
• Subjects: Materials-Surfaces.; Thin films.; Amorphous substances.; Complex fluids.; Solid state physics.; Spectroscopy.; Microscopy.; Surfaces and Interfaces, Thin Films.; Soft and Granular Matter, Complex Fluids and Microfluidics.; Solid State Physics.; Spectroscopy and Microscopy.
• Physical Description: IX, 198 p. 28 illus. online resource.
• ISBN: 9783540495253
• ISSN: 0081-3869 ;
• DOI: 10.1007/BFb0112834

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.