Applied Scanning Probe Methods XII Characterization /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Bhushan, Bharat (Επιμελητής έκδοσης), Fuchs, Harald (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
• Σειρά: NanoScience and Technology,
• Θέματα: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore...