Applied Scanning Probe Methods XII Characterization /
Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore...
| Corporate Author: | SpringerLink (Online service) |
|---|---|
| Other Authors: | Bhushan, Bharat (Editor), Fuchs, Harald (Editor) |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2009.
|
| Series: | NanoScience and Technology,
|
| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
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