Applied Scanning Probe Methods XII Characterization /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Bhushan, Bharat (Επιμελητής έκδοσης), Fuchs, Harald (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
• Σειρά: NanoScience and Technology,
• Θέματα: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where exible substrates will play a major role these issues will become of utmost importance. It is therefore...

Πίνακας περιεχομένων:

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• Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM
• Applications of Scanning Near-Field Optical Microscopy in Life Science
• Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM
• Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning
• Mechanical Properties of Metallic Nanocontacts
• Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids
• Microtensile Tests Using In Situ Atomic Force Microscopy
• Scanning Tunneling Microscopy of the Si(111)-7×7 Surface and Adsorbed Ge Nanostructures.