X-ray and Neutron Reflectivity Principles and Applications /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Daillant, Jean (Editor), Gibaud, Alain (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Series: Lecture Notes in Physics, 770
• Subjects: Physics.; Solid state physics.; Spectroscopy.; Microscopy.; Materials science.; Materials > Surfaces.; Thin films.; Solid State Physics.; Spectroscopy and Microscopy.; Surfaces and Interfaces, Thin Films.; Characterization and Evaluation of Materials.

This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and th...