X-ray and Neutron Reflectivity Principles and Applications /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Daillant, Jean (Επιμελητής έκδοσης), Gibaud, Alain (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Σειρά: Lecture Notes in Physics, 770
• Θέματα: Physics.; Solid state physics.; Spectroscopy.; Microscopy.; Materials science.; Materials > Surfaces.; Thin films.; Solid State Physics.; Spectroscopy and Microscopy.; Surfaces and Interfaces, Thin Films.; Characterization and Evaluation of Materials.

This book is the first comprehensive introduction to X-ray and neutron reflectivity techniques and illustrates them with many examples. After a pedagogical introduction on the interaction of X-rays and neutrons with matter, the interplay between the statistics of rough surfaces and interfaces and th...

Πίνακας περιεχομένων:

• The Interaction of X-Rays (and Neutrons) with Matter
• Statistical Aspects of Wave Scattering at Rough Surfaces
• Specular Reflectivity from Smooth and Rough Surfaces
• Diffuse Scattering
• Neutron Reflectometry
• X-Ray Reflectivity by Rough Multilayers
• Grazing Incidence Small-Angle X-Ray Scattering from Nanostructures.