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03794nam a22005775i 4500 |
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978-3-642-01495-6 |
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DE-He213 |
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20151204170842.0 |
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cr nn 008mamaa |
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100301s2009 gw | s |||| 0|eng d |
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|a 9783642014956
|9 978-3-642-01495-6
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|a 10.1007/978-3-642-01495-6
|2 doi
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|a T174.7
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|a TEC027000
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|a 620.5
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|a Noncontact Atomic Force Microscopy
|h [electronic resource] :
|b Volume 2 /
|c edited by Seizo Morita, Franz J. Giessibl, Roland Wiesendanger.
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| 264 |
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1 |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg,
|c 2009.
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| 300 |
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|a XVIII, 401 p. 105 illus., 77 illus. in color.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a text file
|b PDF
|2 rda
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| 490 |
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|a NanoScience and Technology,
|x 1434-4904
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| 505 |
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|a Method for Precise Force Measurements -- Force Spectroscopy on Semiconductor Surfaces -- Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces -- Force Field Spectroscopy in Three Dimensions -- Principles and Applications of the qPlus Sensor -- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond -- Atom Manipulation on Semiconductor Surfaces -- Atomic Manipulation on Metal Surfaces -- Atomic Manipulation on an Insulator Surface -- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM -- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces -- Magnetic Exchange Force Microscopy -- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001) -- Frequency Modulation Atomic Force Microscopy in Liquids -- Biological Applications of FM-AFM in Liquid Environment -- High-Frequency Low Amplitude Atomic Force Microscopy -- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.
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| 520 |
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|a Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.
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| 650 |
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|a Engineering.
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| 650 |
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|a Condensed matter.
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| 650 |
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|a Spectroscopy.
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| 650 |
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|a Microscopy.
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| 650 |
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|a Mechanics.
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| 650 |
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|a Mechanics, Applied.
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|a Nanotechnology.
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|a Engineering.
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| 650 |
2 |
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|a Nanotechnology and Microengineering.
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| 650 |
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4 |
|a Spectroscopy and Microscopy.
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| 650 |
2 |
4 |
|a Theoretical and Applied Mechanics.
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| 650 |
2 |
4 |
|a Nanotechnology.
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| 650 |
2 |
4 |
|a Engineering, general.
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| 650 |
2 |
4 |
|a Condensed Matter Physics.
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| 700 |
1 |
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|a Morita, Seizo.
|e editor.
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| 700 |
1 |
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|a Giessibl, Franz J.
|e editor.
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| 700 |
1 |
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|a Wiesendanger, Roland.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 776 |
0 |
8 |
|i Printed edition:
|z 9783642014949
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| 830 |
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|a NanoScience and Technology,
|x 1434-4904
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| 856 |
4 |
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|u http://dx.doi.org/10.1007/978-3-642-01495-6
|z Full Text via HEAL-Link
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| 912 |
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|a ZDB-2-CMS
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| 950 |
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|a Chemistry and Materials Science (Springer-11644)
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