Noncontact Atomic Force Microscopy Volume 2 /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Morita, Seizo (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Series: NanoScience and Technology,
• Subjects: Engineering.; Condensed matter.; Spectroscopy.; Microscopy.; Mechanics.; Mechanics, Applied.; Nanotechnology.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Theoretical and Applied Mechanics.; Engineering, general.; Condensed Matter Physics.

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...