Noncontact Atomic Force Microscopy Volume 2 /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Morita, Seizo (Editor), Giessibl, Franz J. (Editor), Wiesendanger, Roland (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
• Series: NanoScience and Technology,
• Subjects: Engineering.; Condensed matter.; Spectroscopy.; Microscopy.; Mechanics.; Mechanics, Applied.; Nanotechnology.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Theoretical and Applied Mechanics.; Engineering, general.; Condensed Matter Physics.

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

Table of Contents:

• Method for Precise Force Measurements
• Force Spectroscopy on Semiconductor Surfaces
• Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces
• Force Field Spectroscopy in Three Dimensions
• Principles and Applications of the qPlus Sensor
• Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond
• Atom Manipulation on Semiconductor Surfaces
• Atomic Manipulation on Metal Surfaces
• Atomic Manipulation on an Insulator Surface
• Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM
• Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces
• Magnetic Exchange Force Microscopy
• First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
• Frequency Modulation Atomic Force Microscopy in Liquids
• Biological Applications of FM-AFM in Liquid Environment
• High-Frequency Low Amplitude Atomic Force Microscopy
• Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.