New Horizons of Applied Scanning Electron Microscopy

• Κύριοι συγγραφείς: Shimizu, Kenichi (Συγγραφέας), Mitani, Tomoaki (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
• Σειρά: Springer Series in Surface Sciences, 45
• Θέματα: Materials science.; Solid state physics.; Physical measurements.; Measurement.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Thin films.; Materials Science.; Surfaces and Interfaces, Thin Films.; Measurement Science and Instrumentation.; Solid State Physics.; Spectroscopy and Microscopy.; Nanotechnology and Microengineering.

In modern scanning electron microscopy, sample surface preparation is of key importance, just as it is in transmission electron microscopy. With the procedures for sample surface preparation provided in the present book, the enormous potential of advanced scanning electron microscopes can be realize...