Scanning Probe Microscopy in Nanoscience and Nanotechnology

Scanning Probe Microscopy in Nanoscience and Nanotechnology

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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various mater...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Bhushan, Bharat (Editor)
Format: Electronic eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
Series:NanoScience and Technology,
Subjects:
Materials science.
Condensed matter.
Engineering.
Nanotechnology.
Materials Science.
Condensed Matter Physics.
Engineering, general.
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ΒΚΠ - Πατρα: ALFd

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Call Number: 330.01 BAU
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ΒΚΠ - Πατρα: BSC

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Call Number: 330.01 BAU
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