Scanning Probe Microscopy in Nanoscience and Nanotechnology

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Bhushan, Bharat (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
• Σειρά: NanoScience and Technology,
• Θέματα: Materials science.; Condensed matter.; Engineering.; Nanotechnology.; Materials Science.; Condensed Matter Physics.; Engineering, general.
• Φυσική περιγραφή: XXX, 956 p. 300 illus. online resource.
• ISBN: 9783642035357
• ISSN: 1434-4904

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.