Scanning Probe Microscopy in Nanoscience and Nanotechnology

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various mater...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Bhushan, Bharat (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2010.
Σειρά:NanoScience and Technology,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Scanning Probe Microscopy Techniques
  • Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids
  • Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy
  • Polarization-Sensitive Tip-Enhanced Raman Scattering
  • Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes
  • Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics
  • Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity
  • Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter
  • Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope
  • Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy
  • Characterization
  • Simultaneous Topography and Recognition Imaging
  • Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM
  • Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules
  • Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices
  • Quantized Mechanics of Nanotubes and Bundles
  • Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials
  • Mechanical Properties of One-Dimensional Nanostructures
  • Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale
  • Controlling Wear on Nanoscale
  • Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping
  • Industrial Applications
  • Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture
  • Near-Field Optical Litography
  • A New AFM-Based Lithography Method: Thermochemical Nanolithography
  • Scanning Probe Alloying Nanolithography
  • Structuring the Surface of Crystallizable Polymers with an AFM Tip
  • Application of Contact Mode AFM to Manufacturing Processes
  • Scanning Probe Microscopy as a Tool Applied to Agriculture.