Optical Measurement of Surface Topography

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Leach, Richard (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2011.
• Θέματα: Materials science.; Physical measurements.; Measurement.; Microwaves.; Optical engineering.; Materials > Surfaces.; Thin films.; Materials Science.; Characterization and Evaluation of Materials.; Microwaves, RF and Optical Engineering.; Measurement Science and Instrumentation.; Surfaces and Interfaces, Thin Films.

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and bi...