Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments /

• Κύριοι συγγραφείς: Xie, Hui (Συγγραφέας), Onal, Cagdas (Συγγραφέας), Régnier, Stéphane (Συγγραφέας), Sitti, Metin (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2012.
• Σειρά: Springer Tracts in Advanced Robotics, 71
• Θέματα: Engineering.; Artificial intelligence.; Nanotechnology.; Robotics.; Automation.; Robotics and Automation.; Artificial Intelligence (incl. Robotics).; Nanotechnology and Microengineering.

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-m...