Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments /
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-m...
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Bibliographic Details
| Main Authors: |
Xie, Hui
(Author),
Onal, Cagdas
(Author),
Régnier, Stéphane
(Author),
Sitti, Metin
(Author) |
|---|
| Corporate Author: |
SpringerLink (Online service) |
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| Format: | Electronic
eBook
|
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| Language: | English |
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| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg,
2012.
|
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| Series: | Springer Tracts in Advanced Robotics,
71
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| Subjects: | |
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| Online Access: | Full Text via HEAL-Link
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