Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Sadewasser, Sascha (Επιμελητής έκδοσης), Glatzel, Thilo (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2012.
• Σειρά: Springer Series in Surface Sciences, 48
• Θέματα: Materials science.; Thermodynamics.; Heat engineering.; Heat transfer.; Mass transfer.; Materials > Surfaces.; Thin films.; Materials Science.; Surfaces and Interfaces, Thin Films.; Engineering Thermodynamics, Heat and Mass Transfer.

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructur...

Πίνακας περιεχομένων:

• Introduction
• I. Technical Aspects
• Experimental technique and working modes
• Phase Modulation Kelvin Probe Microscopy
• Data interpretation, spatial resolution and deconvolution
• Contribution of the numerical approach to Kelvin probe force microscopies
• Quantum mechanical simulations of electrostatic tip-sample interactions
• II. Selected Applications
• Surface properties of III-V semiconductors
• Electronic surface properties of semiconductors devices
• Optoelectronic studies of solar cells
• Electrical characterization of low dimensional systems (quantum/nano-structures)
• Electronic structure of molecular assemblies
• KPFM for biochemical analysis
• Local work function analysis of photo catalysts
• Kelvin probe force microscopy with atomic resolution
• Summary.