X-Ray Absorption Spectroscopy of Semiconductors

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Schnohr, Claudia S. (Επιμελητής έκδοσης), Ridgway, Mark C. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
• Σειρά: Springer Series in Optical Sciences, 190
• Θέματα: Physics.; Optics.; Electrodynamics.; Semiconductors.; Spectroscopy.; Microscopy.; Optical materials.; Electronic materials.; Materials science.; Optical and Electronic Materials.; Spectroscopy and Microscopy.; Characterization and Evaluation of Materials.; Applied and Technical Physics.; Optics and Electrodynamics.

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic...