X-Ray Absorption Spectroscopy of Semiconductors

• Corporate Author: SpringerLink (Online service)
• Other Authors: Schnohr, Claudia S. (Editor), Ridgway, Mark C. (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
• Series: Springer Series in Optical Sciences, 190
• Subjects: Physics.; Optics.; Electrodynamics.; Semiconductors.; Spectroscopy.; Microscopy.; Optical materials.; Electronic materials.; Materials science.; Optical and Electronic Materials.; Spectroscopy and Microscopy.; Characterization and Evaluation of Materials.; Applied and Technical Physics.; Optics and Electrodynamics.

X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic...