Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

• Κύριος συγγραφέας: Voigtländer, Bert (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
• Σειρά: NanoScience and Technology,
• Θέματα: Materials science.; Condensed matter.; Nanotechnology.; Materials Science.; Nanotechnology and Microengineering.; Condensed Matter Physics.

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...