Voigtländer, B. (2015). Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. Springer Berlin Heidelberg : Imprint: Springer.
Chicago Style (17th ed.) CitationVoigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2015.
MLA (8th ed.) CitationVoigtländer, Bert. Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy. Springer Berlin Heidelberg : Imprint: Springer, 2015.
Warning: These citations may not always be 100% accurate.