Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

• Κύριος συγγραφέας: Voigtländer, Bert (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
• Σειρά: NanoScience and Technology,
• Θέματα: Materials science.; Condensed matter.; Nanotechnology.; Materials Science.; Nanotechnology and Microengineering.; Condensed Matter Physics.
• Φυσική περιγραφή: XV, 382 p. 189 illus., 148 illus. in color. online resource.
• ISBN: 9783662452400
• ISSN: 1434-4904

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.