Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...
Κύριος συγγραφέας: | Voigtländer, Bert (Συγγραφέας) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2015.
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Σειρά: | NanoScience and Technology,
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Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Παρόμοια τεκμήρια
-
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
Έκδοση: (2011) -
Scanning Probe Microscopy in Nanoscience and Nanotechnology
Έκδοση: (2010) -
Roadmap of Scanning Probe Microscopy
Έκδοση: (2007) -
Nanostructured Thin Films and Nanodispersion Strengthened Coatings
Έκδοση: (2004) -
Three-Dimensional Nanoarchitectures Designing Next-Generation Devices /
Έκδοση: (2011)