Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy /

• Main Author: Voigtländer, Bert (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2015.
• Series: NanoScience and Technology,
• Subjects: Materials science.; Condensed matter.; Nanotechnology.; Materials Science.; Nanotechnology and Microengineering.; Condensed Matter Physics.

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniqu...

Table of Contents:

• Introduction
• Harmonic Oscillator
• Technical Aspects of Scanning Probe Microscopy
• Scanning Probe Microscopy Designs
• Electronics for Scanning Probe Microscopy
• Lock-In Technique
• Data Representation and Image Processing
• Artifacts in SPM
• Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy
• Surface States
• Forces Between Tip and Sample
• Technical Aspects of Atomic force Microscopy (AFM)
• Static Atomic Force Microscopy
• Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
• Intermittent Contact Mode/Tapping Mode
• Mapping of Mechanical Properties Using Force-Distance Curves
• Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy
• Noise in Atomic Force Microscopy
• Quartz Sensors in Atomic force Microscopy
• Scanning Tunneling Microscopy
• Scanning Tunneling Spectroscopy (STS)
• Vibrational Spectroscopy with the STM
• Spectroscopy and Imaging of Surface States
• Building Nanostructures Atom by Atom.