Electron Nano-Imaging Basics of Imaging and Diffraction for TEM and STEM /

• Κύριος συγγραφέας: Tanaka, Nobuo (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Tokyo : Springer Japan : Imprint: Springer, 2017.
• Θέματα: Materials science.; Spectroscopy.; Nanoscale science.; Nanoscience.; Nanostructures.; Microscopy.; Materials Science.; Characterization and Evaluation of Materials.; Spectroscopy and Microscopy.; Spectroscopy/Spectrometry.; Nanoscale Science and Technology.

In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main...