Tanaka, N. (2017). Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM. Springer Japan : Imprint: Springer.
Παραπομπή σε μορφή Chicago (17η εκδ.)Tanaka, Nobuo. Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM. Tokyo: Springer Japan : Imprint: Springer, 2017.
Παραπομπή σε μορφή MLA (8th εκδ.)Tanaka, Nobuo. Electron Nano-Imaging: Basics of Imaging and Diffraction for TEM and STEM. Springer Japan : Imprint: Springer, 2017.
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