| Περίληψη: | In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, mechanism of electron lens, and scattering/diffraction theories, which are explained in detail separately in the appendices. A comprehensive explanation is provided using Fourier transform theory. This approach is unique in comparison with other advanced textbooks on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by facts about electron microscopic imaging. The up-to-date information in this book, particularly for imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
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