VLSI Design and Test for Systems Dependability

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how e...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Asai, Shojiro (Editor, http://id.loc.gov/vocabulary/relators/edt)
Format: Electronic eBook
Language:English
Published: Tokyo : Springer Japan : Imprint: Springer, 2019.
Edition:1st ed. 2019.
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ΒΚΠ - Πατρα: ALFd

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