VLSI Design and Test for Systems Dependability

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Asai, Shojiro (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Tokyo : Springer Japan : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Θέματα: Electronic circuits.; Quality control.; Reliability.; Industrial safety.; Engineering design.; Computer security.; Circuits and Systems.; Electronic Circuits and Devices.; Quality Control, Reliability, Safety and Risk.; Engineering Design.; Systems and Data Security.

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how e...