APA (7th ed.) Citation

SpringerLink (Online service) & Mahapatra, S. (2016). Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (1st ed. 2015.). Springer India : Imprint: Springer.

Chicago Style (17th ed.) Citation

SpringerLink (Online service) and Souvik Mahapatra. Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling. 1st ed. 2015. New Delhi: Springer India : Imprint: Springer, 2016.

MLA (8th ed.) Citation

SpringerLink (Online service) and Souvik Mahapatra. Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling. 1st ed. 2015. Springer India : Imprint: Springer, 2016.