SpringerLink (Online service) & Mahapatra, S. (2016). Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling (1st ed. 2015.). Springer India : Imprint: Springer.
Παραπομπή σε μορφή Chicago (17η εκδ.)SpringerLink (Online service) και Souvik Mahapatra. Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling. 1st ed. 2015. New Delhi: Springer India : Imprint: Springer, 2016.
Παραπομπή σε μορφή MLA (8th εκδ.)SpringerLink (Online service) και Souvik Mahapatra. Fundamentals of Bias Temperature Instability in MOS Transistors: Characterization Methods, Process and Materials Impact, DC and AC Modeling. 1st ed. 2015. Springer India : Imprint: Springer, 2016.
