Efficient Test Methodologies for High-Speed Serial Links

• Κύριοι συγγραφείς: Hong, Dongwoo (Συγγραφέας), Cheng, Kwang-Ting (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands, 2010.
• Σειρά: Lecture Notes in Electrical Engineering, 51
• Θέματα: Computer science.; Microprocessors.; Computer engineering.; Electronic circuits.; Computer Science.; Computer Engineering.; Circuits and Systems.; Register-Transfer-Level Implementation.

With the increasing demand for higher data bandwidth, communication systems’ data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to...

Πίνακας περιεχομένων:

• An Efficient Jitter Measurement Technique
• BER Estimation for Linear Clock and Data Recovery Circuit
• BER Estimation for Non-linear Clock and Data Recovery Circuit
• Gaps in Timing Margining Test
• An Accurate Jitter Estimation Technique
• A Two-Tone Test Method for Continuous-Time Adaptive Equalizers
• Conclusions.