Efficient Test Methodologies for High-Speed Serial Links
With the increasing demand for higher data bandwidth, communication systems’ data rates have reached the multi-gigahertz range and even beyond. Advances in semiconductor technologies have accelerated the adoption of high-speed serial interfaces, such as PCI-Express, Serial-ATA, and XAUI, in order to...
| Main Authors: | , |
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| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Dordrecht :
Springer Netherlands,
2010.
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| Series: | Lecture Notes in Electrical Engineering,
51 |
| Subjects: | |
| Online Access: | Full Text via HEAL-Link |
Table of Contents:
- An Efficient Jitter Measurement Technique
- BER Estimation for Linear Clock and Data Recovery Circuit
- BER Estimation for Non-linear Clock and Data Recovery Circuit
- Gaps in Timing Margining Test
- An Accurate Jitter Estimation Technique
- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers
- Conclusions.