APA (7th ed.) Citation

Franco, J., Kaczer, B., & Groeseneken, G. (2014). Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. Springer Netherlands : Imprint: Springer.

Chicago Style (17th ed.) Citation

Franco, Jacopo, Ben Kaczer, and Guido Groeseneken. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. Dordrecht: Springer Netherlands : Imprint: Springer, 2014.

MLA (8th ed.) Citation

Franco, Jacopo, et al. Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications. Springer Netherlands : Imprint: Springer, 2014.