Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms /

• Κύριος συγγραφέας: Zjajo, Amir (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
• Σειρά: Springer Series in Advanced Microelectronics, 48
• Θέματα: Physics.; Biomathematics.; Electronic circuits.; Statistical physics.; Dynamical systems.; Applied mathematics.; Engineering mathematics.; Electronic Circuits and Devices.; Circuits and Systems.; Statistical Physics, Dynamical Systems and Complexity.; Appl.Mathematics/Computational Methods of Engineering.; Physiological, Cellular and Medical Topics.

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...