Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms /

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...

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Bibliographic Details
Main Author: Zjajo, Amir (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
Series:Springer Series in Advanced Microelectronics, 48
Subjects:
Online Access:Full Text via HEAL-Link

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