Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms /

• Main Author: Zjajo, Amir (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
• Series: Springer Series in Advanced Microelectronics, 48
• Subjects: Physics.; Biomathematics.; Electronic circuits.; Statistical physics.; Dynamical systems.; Applied mathematics.; Engineering mathematics.; Electronic Circuits and Devices.; Circuits and Systems.; Statistical Physics, Dynamical Systems and Complexity.; Appl.Mathematics/Computational Methods of Engineering.; Physiological, Cellular and Medical Topics.

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...

Table of Contents:

• 1 Introduction
• 2 Random Process Variation in Deep-Submicron CMOS
• 3 Electronic Noise in Deep-Submicron CMOS
• 4 Thermal Effects in Deep-Submicron CMOS
• 5 Circuit Solutions
• 6 Conclusions and Recommendations
• Appendix. References
• Acknowledgement
• About the Author.