SpringerLink (Online service), Park, B., Ishiwara, H., Okuyama, M., Sakai, S., & Yoon, S. (2016). Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications. Springer Netherlands : Imprint: Springer.
Παραπομπή σε μορφή Chicago (17η εκδ.)SpringerLink (Online service), Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, και Sung-Min Yoon. Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications. Dordrecht: Springer Netherlands : Imprint: Springer, 2016.
Παραπομπή σε μορφή MLA (8th εκδ.)SpringerLink (Online service), et al. Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications. Springer Netherlands : Imprint: Springer, 2016.
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