SpringerLink (Online service), Park, B., Ishiwara, H., Okuyama, M., Sakai, S., & Yoon, S. (2016). Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications. Springer Netherlands : Imprint: Springer.
Chicago Style (17th ed.) CitationSpringerLink (Online service), Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, and Sung-Min Yoon. Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications. Dordrecht: Springer Netherlands : Imprint: Springer, 2016.
MLA (8th ed.) CitationSpringerLink (Online service), et al. Ferroelectric-Gate Field Effect Transistor Memories: Device Physics and Applications. Springer Netherlands : Imprint: Springer, 2016.
Warning: These citations may not always be 100% accurate.