CMOS RF Circuit Design for Reliability and Variability

• Κύριος συγγραφέας: Yuan, Jiann-Shiun (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2016.
• Σειρά: SpringerBriefs in Applied Sciences and Technology,
• Θέματα: Engineering.; Electronic circuits.; Microwaves.; Optical engineering.; Circuits and Systems.; Electronic Circuits and Devices.; Microwaves, RF and Optical Engineering.

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...