CMOS RF Circuit Design for Reliability and Variability

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Yuan, Jiann-Shiun (Συγγραφέας)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2016.
Σειρά:SpringerBriefs in Applied Sciences and Technology,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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020 |a 9789811008849  |9 978-981-10-0884-9 
024 7 |a 10.1007/978-981-10-0884-9  |2 doi 
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100 1 |a Yuan, Jiann-Shiun.  |e author. 
245 1 0 |a CMOS RF Circuit Design for Reliability and Variability  |h [electronic resource] /  |c by Jiann-Shiun Yuan. 
264 1 |a Singapore :  |b Springer Singapore :  |b Imprint: Springer,  |c 2016. 
300 |a VI, 106 p. 101 illus.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
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490 1 |a SpringerBriefs in Applied Sciences and Technology,  |x 2191-530X 
505 0 |a CMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability. 
520 |a The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations. 
650 0 |a Engineering. 
650 0 |a Electronic circuits. 
650 0 |a Microwaves. 
650 0 |a Optical engineering. 
650 1 4 |a Engineering. 
650 2 4 |a Circuits and Systems. 
650 2 4 |a Electronic Circuits and Devices. 
650 2 4 |a Microwaves, RF and Optical Engineering. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9789811008825 
830 0 |a SpringerBriefs in Applied Sciences and Technology,  |x 2191-530X 
856 4 0 |u http://dx.doi.org/10.1007/978-981-10-0884-9  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)