CMOS RF Circuit Design for Reliability and Variability

• Main Author: Yuan, Jiann-Shiun (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Singapore : Springer Singapore : Imprint: Springer, 2016.
• Series: SpringerBriefs in Applied Sciences and Technology,
• Subjects: Engineering.; Electronic circuits.; Microwaves.; Optical engineering.; Circuits and Systems.; Electronic Circuits and Devices.; Microwaves, RF and Optical Engineering.

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typic...