LabVIEW based Automation Guide for Microwave Measurements

The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Dubey, Satya Kesh (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Narang, Naina (http://id.loc.gov/vocabulary/relators/aut), Negi, P. S. (http://id.loc.gov/vocabulary/relators/aut), Ojha, V. N. (http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
Έκδοση:1st ed. 2018.
Σειρά:SpringerBriefs in Computational Electromagnetics,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 1 0 |a LabVIEW based Automation Guide for Microwave Measurements  |h [electronic resource] /  |c by Satya Kesh Dubey, Naina Narang, P. S. Negi, V. N. Ojha. 
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490 1 |a SpringerBriefs in Computational Electromagnetics,  |x 2365-6239 
520 |a The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and software development for measurement. The book can be used as a guide by technicians, researchers and scientists involved in metrology laboratories to automate measurements. The book explains the development process for automation of measurement systems for every step of the software development lifecycle. It covers system design and automation policy creation. The book uses a top-down approach which enables the reader to relate their own problems and develop a system with their own analysis. The book includes many examples, illustrations, flowcharts, measurement results and screenshots of a worked-out automation software for microwave measurement. The book includes discussions on microwave measurements-attenuation, microwave power and E-field strength. The contents of this book will be of interest to students, researchers and scientists working in the field of electromagnetism, antennas, communication and electromagnetic interference/electromagnetic compatibility (EMI/EMC). . 
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700 1 |a Narang, Naina.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
700 1 |a Negi, P. S.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
700 1 |a Ojha, V. N.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
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