LabVIEW based Automation Guide for Microwave Measurements

• Κύριοι συγγραφείς: Dubey, Satya Kesh (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Narang, Naina (http://id.loc.gov/vocabulary/relators/aut), Negi, P. S. (http://id.loc.gov/vocabulary/relators/aut), Ojha, V. N. (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Singapore : Springer Singapore : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: SpringerBriefs in Computational Electromagnetics,
• Θέματα: Microwaves.; Optical engineering.; Physics.; Electrical engineering.; Microwaves, RF and Optical Engineering.; Numerical and Computational Physics, Simulation.; Communications Engineering, Networks.

The book is focused on measurement automation, specifically using the LabView tool. It explains basic measurements in a simplified manner with appropriate step-by-step explanations and discussions of instrument capabilities. It touches upon aspects of measurement science, microwave measurements and...